YXLON FF65 CL

World’s best resolution 3D X-ray inspection system for fully automated verification of IC packaging defects

Semiconductor manufacturing requires automated, high quality, reliable, fast and non-destructive inspection and analysis for an optimum production as defects can be found on the wafer, on a substrate, on a strip or in the subassembly of a final
device. The new X-ray inspection system YXLON FF65 CL has especially been designed to provide the best automatic analysis of smallest and most demanding features within the 3D IC, MEMS and sensors. The result: impressively precise and reproducible test and inspection excellence.


 
   
  • High-speed 3D AXI brings about a revolution in the semiconductor process management
  • Most precise measurements of defect dimensions for advanced 3D IC packeging, MEMS and Sensors
  • Best reliable and reproducible check of process conditions and defect parameters
  • Leading-edge simple and easy operation with fully automated wafer handling and testing process

System Capabilities

The perfect solution for high-volume, automated and reliable semiconductor joint analysis

The YXLON FF65 CL is distinguished by its large inspection area of 510 x 610 mm and the detectability of < 300 nm, making it ideal for automatically and non-destruc-tively analyzing solder bumps and filled vias in 3D ICs, flip chips and wafers.  The innovative vacuum mechanism of the system manipulator holds the sample securely and precisely during analysis and counteracts the effects of sample warpage. 

The FF65 CL provides 2D (top-down) with a high-performance flat-panel and 3D (CL – Computed Laminography) automated analysis using a high-resolu¬tion Image Intensifier within a special mani-pulation assembly for its inclined rotations.The latest generation of nano-focus X-ray tubes creates 2D and 3D images that can reveal and measure the smallest voids and features. This enables the YXLON FF65 CL to analyze the most demanding advanced semiconductor challenges. 

A user-friendly and intuitive graphical user interface (GUI) allows the easy creation of automated, multi-point and multi-functional analysis inspection programs. 

Measurement repeatability over time is ensured by automatic, continuously monitoring background calibration tests over all aspects of the system.  Your benefits for semiconductor production Improved quality monitoring – inspect more locations at better resolution to identify failures that otherwise could be missed Significant cost reduction through better test coverage leading to improved yield  Reliable and reproducible check of consistency of process and defect parameters at any time  This innovative automated analysis solution is easy to use, optimizing cost of operation

 
System properties at a glance: 
  • Automated high-throughput analysis with the best repro-ducibility and reliability of the results 
  • Simple creation of automated, multi-point and multi-functional analysis inspection programs allowing rapid change between sample and measurement tasks 
  • Continuous background monitoring and optimization to ensure measurement repeatability and accuracy 
  • Fast and reproducible accuracy of all measurements 

Technische Daten

Merkmal Wert
Durchmesser Prüfteil 795 [mm] (30.1")
Höhe Prüfteil 20 [mm] (0.7")
Maximales Gewicht Prüfteil 2 [kg]
Systemmaße (B/T/H) 1760 x 2000 x 2000 [mm]
CT-Modi Superhochauflösende Computerlaminographie (CL)
Manipulation Hochpräziser Manipulator, aktives Anti-Vibrationssystem, höchste Zuverlässigkeit

Kontaktieren Sie uns, um mehr zu erfahren:

YXLON Sales & Service LocationNDT/Elektronikc/o Comet Technologies USA, Inc.5675 Hudson Industrial ParkwayHudson, OH 44236USAToll free: 877-XRAY-100yxlon@yxlon.com+1 234 284 7849